The Shear test as interface characterization tool applied to the Si-BCB interface

Metadata

Show full item record

Authors

Degryse, Dominiek; Vandevelde, Bart; Beyne, Eric; Degrieck, Joris

ISSN

1043-7398

Issue

4

Journal

Journal of Electronic Packaging

Volume

131

Title

The Shear test as interface characterization tool applied to the Si-BCB interface

Publication type

Journal article

Collections

Articles