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The Shear test as interface characterization tool applied to the Si-BCB interface
Publication:
The Shear test as interface characterization tool applied to the Si-BCB interface
Date
2009
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Degryse, Dominiek
;
Vandevelde, Bart
;
Beyne, Eric
;
Degrieck, Joris
Journal
Journal of Electronic Packaging
Abstract
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1888
since deposited on 2021-10-17
Acq. date: 2025-10-28
Citations
Metrics
Views
1888
since deposited on 2021-10-17
Acq. date: 2025-10-28
Citations