Publication:
The Shear test as interface characterization tool applied to the Si-BCB interface
Date
| dc.contributor.author | Degryse, Dominiek | |
| dc.contributor.author | Vandevelde, Bart | |
| dc.contributor.author | Beyne, Eric | |
| dc.contributor.author | Degrieck, Joris | |
| dc.contributor.imecauthor | Vandevelde, Bart | |
| dc.contributor.imecauthor | Beyne, Eric | |
| dc.contributor.orcidimec | Vandevelde, Bart::0000-0002-6753-6438 | |
| dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
| dc.date.accessioned | 2021-10-17T21:54:00Z | |
| dc.date.available | 2021-10-17T21:54:00Z | |
| dc.date.issued | 2009 | |
| dc.identifier.issn | 1043-7398 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15213 | |
| dc.source.beginpage | 41003 | |
| dc.source.issue | 4 | |
| dc.source.journal | Journal of Electronic Packaging | |
| dc.source.volume | 131 | |
| dc.title | The Shear test as interface characterization tool applied to the Si-BCB interface | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
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