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Fin width influence on the harmonic distortion of standard and strained FinFETs operating in saturation
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Authors
Doria, R.T.
;
Cerdeira, A.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
;
Pavanello, M.A.
Conference
24th Symposium on Microelectronics Technology and Devices - SBMicro
Title
Fin width influence on the harmonic distortion of standard and strained FinFETs operating in saturation
Publication type
Proceedings paper
Embargo date
9999-12-31
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