Show simple item record

Quantification of drain extension leakage in a scaled bulk germanium pMOS technology

dc.contributor.authorEneman, Geert
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorSimoen, Eddy
dc.contributor.authorBrunco, David
dc.contributor.authorHellings, Geert
dc.contributor.authorMitard, Jerome
dc.contributor.authorDe Meyer, Kristin
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.date.accessioned2021-10-17T22:06:25Z
dc.date.available2021-10-17T22:06:25Z
dc.date.issued2009
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15275
dc.sourceIIOimport
dc.titleQuantification of drain extension leakage in a scaled bulk germanium pMOS technology
dc.typeJournal article
dc.contributor.imecauthorEneman, Geert
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHellings, Geert
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorDe Meyer, Kristin
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecEneman, Geert::0000-0002-5849-3384
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHellings, Geert::0000-0002-5376-2119
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage3115
dc.source.endpage3122
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue12
dc.source.volume56
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
19064.pdf
Size:
1017.Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record