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Quantification of drain extension leakage in a scaled bulk germanium pMOS technology
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Authors
Eneman, Geert
;
De Jaeger, Brice
;
Simoen, Eddy
;
Brunco, David
;
Hellings, Geert
;
Mitard, Jerome
;
De Meyer, Kristin
;
Meuris, Marc
;
Heyns, Marc
ISSN
0018-9383
Issue
12
Journal
IEEE Transactions on Electron Devices
Volume
56
Title
Quantification of drain extension leakage in a scaled bulk germanium pMOS technology
Publication type
Journal article
Embargo date
9999-12-31
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