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Articles
Quantification of drain extension leakage in a scaled bulk germanium pMOS technology
Publication:
Quantification of drain extension leakage in a scaled bulk germanium pMOS technology
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Date
2009
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Eneman, Geert
;
De Jaeger, Brice
;
Simoen, Eddy
;
Brunco, David
;
Hellings, Geert
;
Mitard, Jerome
;
De Meyer, Kristin
;
Meuris, Marc
;
Heyns, Marc
Journal
IEEE Transactions on Electron Devices
Abstract
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1972
since deposited on 2021-10-17
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last month
Acq. date: 2025-12-15
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Metrics
Views
1972
since deposited on 2021-10-17
1
last month
Acq. date: 2025-12-15
Citations