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A CMOS circuit for evaluating the NBTI over a wide frequency range

dc.contributor.authorFernandez-Garcia, Raul
dc.contributor.authorKaczer, Ben
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-17T22:12:52Z
dc.date.available2021-10-17T22:12:52Z
dc.date.issued2009
dc.identifier.issn0026-2714
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15305
dc.sourceIIOimport
dc.titleA CMOS circuit for evaluating the NBTI over a wide frequency range
dc.typeJournal article
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.beginpage885
dc.source.endpage891
dc.source.journalMicroelectronics Reliability
dc.source.issue8
dc.source.volume49
imec.availabilityPublished - imec


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