A CMOS circuit for evaluating the NBTI over a wide frequency range

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Authors

Fernandez-Garcia, Raul; Kaczer, Ben; Groeseneken, Guido

ISSN

0026-2714

Issue

8

Journal

Microelectronics Reliability

Volume

49

Title

A CMOS circuit for evaluating the NBTI over a wide frequency range

Publication type

Journal article

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