Publication:
A CMOS circuit for evaluating the NBTI over a wide frequency range
Date
| dc.contributor.author | Fernandez-Garcia, Raul | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.date.accessioned | 2021-10-17T22:12:52Z | |
| dc.date.available | 2021-10-17T22:12:52Z | |
| dc.date.issued | 2009 | |
| dc.identifier.issn | 0026-2714 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15305 | |
| dc.source.beginpage | 885 | |
| dc.source.endpage | 891 | |
| dc.source.issue | 8 | |
| dc.source.journal | Microelectronics Reliability | |
| dc.source.volume | 49 | |
| dc.title | A CMOS circuit for evaluating the NBTI over a wide frequency range | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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