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Articles
A CMOS circuit for evaluating the NBTI over a wide frequency range
Publication:
A CMOS circuit for evaluating the NBTI over a wide frequency range
Date
2009
Journal article
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Fernandez-Garcia, Raul
;
Kaczer, Ben
;
Groeseneken, Guido
Journal
Microelectronics Reliability
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1951
since deposited on 2021-10-17
Acq. date: 2025-10-25
Citations
Metrics
Views
1951
since deposited on 2021-10-17
Acq. date: 2025-10-25
Citations