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Structural characterization of thin films and multilayer structures

dc.contributor.authorTemst, K.
dc.contributor.authorVan Bael, M.
dc.contributor.authorBaert, M.
dc.contributor.authorRosseel, Erik
dc.contributor.authorBruyndoncx, V.
dc.contributor.authorStrunk, C.
dc.contributor.authorVerbanck, G.
dc.contributor.authorMaex, Karen
dc.contributor.authorVan Haesendonck, Chris
dc.contributor.authorMoshchalkov, V. V.
dc.contributor.authorBruynseraede, Y.
dc.contributor.authorJonckheere, Rik
dc.contributor.authorde Groot, D. G.
dc.contributor.authorKoeman, N.
dc.contributor.authorGriessen, R.
dc.date.accessioned2021-09-29T15:31:55Z
dc.date.available2021-09-29T15:31:55Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1530
dc.sourceIIOimport
dc.titleStructural characterization of thin films and multilayer structures
dc.typeJournal article
dc.contributor.imecauthorRosseel, Erik
dc.contributor.imecauthorMaex, Karen
dc.contributor.imecauthorJonckheere, Rik
dc.contributor.orcidimecJonckheere, Rik::0000-0003-2211-9443
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpageC3-265
dc.source.endpageC3-270
dc.source.journalJournal de Physique IV. Colloque 3
dc.source.volume6
imec.availabilityPublished - open access
imec.internalnotesProceedings 2nd European Workshop on Low Temperature Electronics (WOLTE-2). June 26-28, 1996. Leuven, Belgium


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