Structural characterization of thin films and multilayer structures

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Authors

Temst, K.; Van Bael, M.; Baert, M.; Rosseel, Erik; Bruyndoncx, V.; Strunk, C.; Verbanck, G.; Maex, Karen; Van Haesendonck, Chris; Moshchalkov, V. V.; Bruynseraede, Y.; Jonckheere, Rik; de Groot, D. G.; Koeman, N.; Griessen, R.

Journal

Journal de Physique IV. Colloque 3

Volume

6

Title

Structural characterization of thin films and multilayer structures

Publication type

Journal article

Embargo date

9999-12-31

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