Structural characterization of thin films and multilayer structures

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Author(s)

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Van Haesendonck, Chris

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Moshchalkov, V. V.

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Bruynseraede, Y.

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Jonckheere, Rik

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de Groot, D. G.

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Journal

Journal de Physique IV. Colloque 3

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1997 since deposited on 2021-09-29

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Acq. date: 2025-10-24