Publication:

Structural characterization of thin films and multilayer structures

Date

1996
Journal article
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Author(s)

Temst, K.
;
Van Bael, M.
;
Baert, M.
;
Rosseel, Erik  
;
Bruyndoncx, V.
;
Strunk, C.
;
Verbanck, G.
;
Maex, Karen  
;
Van Haesendonck, Chris
;
Moshchalkov, V. V.
;
Bruynseraede, Y.
;
Jonckheere, Rik  
;
de Groot, D. G.
;
Koeman, N.
;
Griessen, R.

Journal

Journal de Physique IV. Colloque 3

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2000 since deposited on 2021-09-29
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