Publication:

Structural characterization of thin films and multilayer structures

Date

1996
Journal article
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dc.contributor.authorTemst, K.
dc.contributor.authorVan Bael, M.
dc.contributor.authorBaert, M.
dc.contributor.authorRosseel, Erik
dc.contributor.authorBruyndoncx, V.
dc.contributor.authorStrunk, C.
dc.contributor.authorVerbanck, G.
dc.contributor.authorMaex, Karen
dc.contributor.authorVan Haesendonck, Chris
dc.contributor.authorMoshchalkov, V. V.
dc.contributor.authorBruynseraede, Y.
dc.contributor.authorJonckheere, Rik
dc.contributor.authorde Groot, D. G.
dc.contributor.authorKoeman, N.
dc.contributor.authorGriessen, R.
dc.contributor.imecauthorRosseel, Erik
dc.contributor.imecauthorMaex, Karen
dc.contributor.imecauthorJonckheere, Rik
dc.contributor.orcidimecJonckheere, Rik::0000-0003-2211-9443
dc.date.accessioned2021-09-29T15:31:55Z
dc.date.available2021-09-29T15:31:55Z
dc.date.embargo9999-12-31
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1530
dc.source.beginpageC3-265
dc.source.endpageC3-270
dc.source.journalJournal de Physique IV. Colloque 3
dc.source.volume6
dc.title

Structural characterization of thin films and multilayer structures

dc.typeJournal article
dspace.entity.typePublication
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