dc.contributor.author | Fleischmann, Claudia | |
dc.contributor.author | Sioncke, Sonja | |
dc.contributor.author | Schouteden, K. | |
dc.contributor.author | Paredis, K. | |
dc.contributor.author | Beckhoff, B. | |
dc.contributor.author | Müller, M. | |
dc.contributor.author | Kolbe, M. | |
dc.contributor.author | Meuris, Marc | |
dc.contributor.author | Van Haesendonck, C. | |
dc.contributor.author | Temst, K. | |
dc.contributor.author | Vantomme, Andre | |
dc.date.accessioned | 2021-10-17T22:15:40Z | |
dc.date.available | 2021-10-17T22:15:40Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15318 | |
dc.source | IIOimport | |
dc.title | Investigations of the surface chemical composition and atomic structure of ex-situ sulfur passivated Ge(100) | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Fleischmann, Claudia | |
dc.contributor.imecauthor | Meuris, Marc | |
dc.contributor.imecauthor | Vantomme, Andre | |
dc.contributor.orcidimec | Fleischmann, Claudia::0000-0003-1531-6916 | |
dc.contributor.orcidimec | Meuris, Marc::0000-0002-9580-6810 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 421 | |
dc.source.endpage | 432 | |
dc.source.conference | Analytical Techniques for Semiconductor Materials and Process Characterization 6 - ALTECH | |
dc.source.conferencedate | 4/10/2009 | |
dc.source.conferencelocation | Vienna Austria | |
imec.availability | Published - open access | |
imec.internalnotes | ECS Transactions; Vol. 25, issue 3 | |