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Low-temperature annealing studies in the divacancy in p-type silicon

dc.contributor.authorTrauwaert, Marie-Astrid
dc.date.accessioned2021-09-29T15:32:57Z
dc.date.available2021-09-29T15:32:57Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1537
dc.sourceIIOimport
dc.titleLow-temperature annealing studies in the divacancy in p-type silicon
dc.typeOral presentation
dc.source.peerreviewno
dc.source.conferencedes 31. Arbeitskreises Punkdefekte; June 12-13, 1996; Stuttgart, Germany.
dc.source.conferencelocation
imec.availabilityPublished - imec


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