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Understanding negative bias temperature instability in the context of hole trapping

dc.contributor.authorGrasser, T.
dc.contributor.authorKaczer, Ben
dc.contributor.authorGoes, W.
dc.contributor.authorAichinger, T.
dc.contributor.authorHehenberger, P.
dc.contributor.authorNelhiebel, M.
dc.date.accessioned2021-10-17T22:32:13Z
dc.date.available2021-10-17T22:32:13Z
dc.date.issued2009
dc.identifier.issn0167-9317
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15390
dc.sourceIIOimport
dc.titleUnderstanding negative bias temperature instability in the context of hole trapping
dc.typeJournal article
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1876
dc.source.endpage1882
dc.source.journalMicroelectronic Engineering
dc.source.issue7_9
dc.source.volume86
imec.availabilityPublished - open access


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