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Critical modeling issues in negative bias temperature instability

dc.contributor.authorGrasser, Tibor
dc.contributor.authorGoes, W.
dc.contributor.authorKaczer, Ben
dc.date.accessioned2021-10-17T22:32:26Z
dc.date.available2021-10-17T22:32:26Z
dc.date.issued2009-05
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15391
dc.sourceIIOimport
dc.titleCritical modeling issues in negative bias temperature instability
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage265
dc.source.endpage287
dc.source.conferenceSilicon Nitride, Silicon Dioxide, and Alternate Emerging Dielectrics 10
dc.source.conferencedate24/05/2009
dc.source.conferencelocationSan Francisco, CA USA
imec.availabilityPublished - open access
imec.internalnotesECS Transactions; Vol. 19; Iss.2


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