A two-stage model for negative bias temperature instability
dc.contributor.author | Grasser, Tibor | |
dc.contributor.author | Kaczer, Ben | |
dc.contributor.author | Goes, Wolfgang | |
dc.contributor.author | Aichinger, Thomas | |
dc.contributor.author | Hehenberger, Philipp | |
dc.contributor.author | Nelhiebel, M. | |
dc.date.accessioned | 2021-10-17T22:33:05Z | |
dc.date.available | 2021-10-17T22:33:05Z | |
dc.date.issued | 2009-04 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15394 | |
dc.source | IIOimport | |
dc.title | A two-stage model for negative bias temperature instability | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Kaczer, Ben | |
dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 33 | |
dc.source.endpage | 44 | |
dc.source.conference | 47th Annual IEEE International Reliability Physics Symposium | |
dc.source.conferencedate | 26/04/2009 | |
dc.source.conferencelocation | Montreal Canada | |
imec.availability | Published - imec |
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