Authors

Grasser, Tibor; Reisinger, Hans; Goes, Wolfgang; Aichinger, Thomas; Hehenberger, Phillip; Wagner, Paul-Jurgen; Nelheibel, M.; Franco, Jacopo; Kaczer, Ben

Conference

IEEE International Electron Devices Meeting - IEDM

Title

Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noise

Publication type

Proceedings paper

Embargo date

9999-12-31