dc.contributor.author | Griffoni, Alessio | |
dc.contributor.author | Gerardin, S. | |
dc.contributor.author | Roussel, Philippe | |
dc.contributor.author | Degraeve, Robin | |
dc.contributor.author | Meneghesso, G. | |
dc.contributor.author | Paccagnella, A. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Claeys, Cor | |
dc.date.accessioned | 2021-10-17T22:33:35Z | |
dc.date.available | 2021-10-17T22:33:35Z | |
dc.date.issued | 2009 | |
dc.identifier.issn | 0018-9499 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15396 | |
dc.source | IIOimport | |
dc.title | A statistical approach to microdose induced degradation in FinFET devices | |
dc.type | Journal article | |
dc.contributor.imecauthor | Roussel, Philippe | |
dc.contributor.imecauthor | Degraeve, Robin | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 3285 | |
dc.source.endpage | 3292 | |
dc.source.journal | IEEE Transactions on Nuclear Science | |
dc.source.issue | 6_1 | |
dc.source.volume | 56 | |
imec.availability | Published - open access | |