A statistical approach to microdose induced degradation in FinFET devices

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Authors
Griffoni, Alessio; Gerardin, S.; Roussel, Philippe; Degraeve, Robin; Meneghesso, G.; Paccagnella, A.; Simoen, Eddy; Claeys, Cor
ISSN
0018-9499
Issue
6_1
Journal
IEEE Transactions on Nuclear Science
Volume
56
Title
A statistical approach to microdose induced degradation in FinFET devices
Publication type
Journal article
Embargo date
9999-12-31
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