A statistical approach to microdose induced degradation in FinFET devices

Simple item page Full metadata Statistics

Files

20171.pdf 702.54 KB

Author(s)

Griffoni, Alessio

;

;

Roussel, Philippe

;

Degraeve, Robin

;

;

Paccagnella, A.

;

;

Journal

IEEE Transactions on Nuclear Science

Metrics

1927 since deposited on 2021-10-17

Acq. date: 2025-12-08