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Design of test modules for the analysis of MCM interconnects

dc.contributor.authorTruzzi, Claudio
dc.contributor.authorBeyne, Eric
dc.contributor.authorRingoot, Edwin
dc.date.accessioned2021-09-29T15:33:19Z
dc.date.available2021-09-29T15:33:19Z
dc.date.issued1996
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1539
dc.sourceIIOimport
dc.titleDesign of test modules for the analysis of MCM interconnects
dc.typeProceedings paper
dc.contributor.imecauthorBeyne, Eric
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage614
dc.source.conferenceProceedings European Design and Test Conference - ED&TC '96
dc.source.conferencedate11/03/1996
dc.source.conferencelocationParis France
imec.availabilityPublished - open access


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