Show simple item record

Characterisation of ~ 100 μm thick (110) oriented P-doped single crystal CVD diamond layers

dc.contributor.authorHaenen, Ken
dc.contributor.authorLazea, Ileana Andrada
dc.contributor.authorBalasubramniam, Y.
dc.contributor.authorMortet, Vincent
dc.contributor.authorJomard, F.
dc.contributor.authorBarjon, J.
dc.date.accessioned2021-10-17T22:38:46Z
dc.date.available2021-10-17T22:38:46Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15418
dc.sourceIIOimport
dc.titleCharacterisation of ~ 100 μm thick (110) oriented P-doped single crystal CVD diamond layers
dc.typeMeeting abstract
dc.contributor.imecauthorHaenen, Ken
dc.contributor.orcidimecHaenen, Ken::0000-0001-6711-7367
dc.source.peerreviewno
dc.source.beginpageJ14.4
dc.source.conferenceMRS Fall Meeting Symposium J: Diamond Electronics and Bioelectronics - Fundamentals to Applications III
dc.source.conferencedate30/11/2009
dc.source.conferencelocationBoston, MA USA
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record