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Do NBTI-induced interface states show fast recovery? A study using a corrected on-the-fly charge-pumping measurement technique

dc.contributor.authorHehenberger, Philipp
dc.contributor.authorAichinger, Thomas
dc.contributor.authorGrasser, Tibor
dc.contributor.authorGoes, Wolfgang
dc.contributor.authorTriebl, O.
dc.contributor.authorKaczer, Ben
dc.contributor.authorNelhiebel, M.
dc.date.accessioned2021-10-17T22:46:30Z
dc.date.available2021-10-17T22:46:30Z
dc.date.issued2009-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15448
dc.sourceIIOimport
dc.titleDo NBTI-induced interface states show fast recovery? A study using a corrected on-the-fly charge-pumping measurement technique
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.source.peerreviewyes
dc.source.beginpage1033
dc.source.endpage1038
dc.source.conference47th Annual IEEE International Reliability Physics Symposium
dc.source.conferencedate26/04/2009
dc.source.conferencelocationMontreal Canada
imec.availabilityPublished - imec


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