dc.contributor.author | Heylen, Nancy | |
dc.contributor.author | Li, Yunlong | |
dc.contributor.author | Kellens, Kristof | |
dc.contributor.author | Travaly, Youssef | |
dc.contributor.author | Vereecke, Guy | |
dc.contributor.author | Volders, Henny | |
dc.contributor.author | Tokei, Zsolt | |
dc.contributor.author | Versluijs, Janko | |
dc.contributor.author | Rip, Jens | |
dc.contributor.author | Van Besien, Els | |
dc.contributor.author | Carbonell, Laure | |
dc.contributor.author | Beyer, Gerald | |
dc.contributor.author | Fischer, Paul | |
dc.contributor.author | Zhao, Larry | |
dc.contributor.author | Santoro, Gaetano | |
dc.contributor.author | Cockburn, Andrew | |
dc.contributor.author | Nguyen, Olivier | |
dc.date.accessioned | 2021-10-17T22:51:36Z | |
dc.date.available | 2021-10-17T22:51:36Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15468 | |
dc.source | IIOimport | |
dc.title | Post-direct-CMP dielectric surface copper contamination: quantitative analysis and impact on dielectric breakdown behaviour | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Heylen, Nancy | |
dc.contributor.imecauthor | Li, Yunlong | |
dc.contributor.imecauthor | Kellens, Kristof | |
dc.contributor.imecauthor | Vereecke, Guy | |
dc.contributor.imecauthor | Volders, Henny | |
dc.contributor.imecauthor | Tokei, Zsolt | |
dc.contributor.imecauthor | Versluijs, Janko | |
dc.contributor.imecauthor | Rip, Jens | |
dc.contributor.imecauthor | Van Besien, Els | |
dc.contributor.imecauthor | Beyer, Gerald | |
dc.contributor.imecauthor | Santoro, Gaetano | |
dc.contributor.imecauthor | Cockburn, Andrew | |
dc.contributor.orcidimec | Li, Yunlong::0000-0003-4791-4013 | |
dc.contributor.orcidimec | Vereecke, Guy::0000-0001-9058-9338 | |
dc.contributor.orcidimec | Van Besien, Els::0000-0002-5174-2229 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 415 | |
dc.source.endpage | 429 | |
dc.source.conference | Advanced Metallization Conference 2008 (AMC2008) | |
dc.source.conferencedate | 23/09/2008 | |
dc.source.conferencelocation | San Diego, CA USA | |
imec.availability | Published - open access | |