Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Conference contributions
Plasma process optimization for dual pattern 30nm half pitch interconnect application
Publication:
Plasma process optimization for dual pattern 30nm half pitch interconnect application
Date
2009
Meeting abstract
Simple item page
Full metadata
Statistics
Loading...
Loading...
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Huffman, Craig
;
de Marneffe, Jean-Francois
;
Demuynck, Steven
;
Goossens, Danny
;
Beyer, Gerald
;
Struyf, Herbert
Journal
Abstract
Description
Metrics
Views
1880
since deposited on 2021-10-17
415
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations
Metrics
Views
1880
since deposited on 2021-10-17
415
item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations