dc.contributor.author | Jonckheere, Rik | |
dc.date.accessioned | 2021-10-17T23:12:30Z | |
dc.date.available | 2021-10-17T23:12:30Z | |
dc.date.issued | 2009 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15544 | |
dc.source | IIOimport | |
dc.title | Influence of capping layer deterioration on printing performance as estimated from simulation | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Jonckheere, Rik | |
dc.contributor.orcidimec | Jonckheere, Rik::0000-0003-2211-9443 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | EUV Mask Cleaning Workshop | |
dc.source.conferencedate | 14/09/2009 | |
dc.source.conferencelocation | Monterey, CA USA | |
imec.availability | Published - open access | |
imec.internalnotes | e-proceedings Sematech website | |