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NBTI from the perspective of defect states with widely distributed time scales

dc.contributor.authorKaczer, Ben
dc.contributor.authorGrasser, Tibor
dc.contributor.authorMartin-Martinez, Javier
dc.contributor.authorSimoen, Eddy
dc.contributor.authorAoulaiche, Marc
dc.contributor.authorRoussel, Philippe
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-17T23:16:14Z
dc.date.available2021-10-17T23:16:14Z
dc.date.issued2009-04
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15558
dc.sourceIIOimport
dc.titleNBTI from the perspective of defect states with widely distributed time scales
dc.typeProceedings paper
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.source.peerreviewyes
dc.source.beginpage55
dc.source.endpage60
dc.source.conference47th Annual IEEE International Reliability Physics Symposium
dc.source.conferencedate26/04/2009
dc.source.conferencelocationMontreal Canada
imec.availabilityPublished - imec


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