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Spectroscopy of defects in epitaxially grown para-sexiphenyl nanostructures

dc.contributor.authorKadashchuk, Andriy
dc.contributor.authorSchols, Sarah
dc.contributor.authorSkryshevski, Yu
dc.contributor.authorBeynik, I.
dc.contributor.authorTeichert, C.
dc.contributor.authorHernandez-Sosa, G.
dc.contributor.authorSitter, H.
dc.contributor.authorAndreev, A.
dc.contributor.authorFrank, P.
dc.contributor.authorWinkler, A.
dc.date.accessioned2021-10-17T23:18:07Z
dc.date.available2021-10-17T23:18:07Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15565
dc.sourceIIOimport
dc.titleSpectroscopy of defects in epitaxially grown para-sexiphenyl nanostructures
dc.typeProceedings paper
dc.contributor.imecauthorKadashchuk, Andriy
dc.contributor.imecauthorSchols, Sarah
dc.source.peerreviewyes
dc.source.beginpage121
dc.source.endpage125
dc.source.conferenceInterface Controlled Organic Thin Films
dc.source.conferencedate26/05/2008
dc.source.conferencelocation
dc.identifier.urlin Interface Controlled Organic Thin Films, (Eds). H.-G. Rubahn, H. Sitter, G. Horowitz, K. Al-Shamery, (Springer GmbH , Vol. XI
imec.availabilityPublished - imec
imec.internalnotesSpringer Proceedings in Physics; Vol. 129


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