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Total-dose effects caused by high-energy neutrons and g-rays in multiple-gate FETs

dc.contributor.authorKilchytska, V.
dc.contributor.authorAlvarado, J.
dc.contributor.authorCollaert, Nadine
dc.contributor.authorRooyackers, Rita
dc.contributor.authorMilitaru, O.
dc.contributor.authorBerger, G.
dc.contributor.authorFlandre, D.
dc.date.accessioned2021-10-17T23:26:04Z
dc.date.available2021-10-17T23:26:04Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15593
dc.sourceIIOimport
dc.titleTotal-dose effects caused by high-energy neutrons and g-rays in multiple-gate FETs
dc.typeProceedings paper
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewno
dc.source.conference10th European Conference on Radiation and Its Effects on Components and Systems - RADECS
dc.source.conferencedate14/09/2009
dc.source.conferencelocationBrugge Belgium
imec.availabilityPublished - imec


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