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Progress in dopant and carrier profiling in GaAs structures

dc.contributor.authorKinder, Rudolf
dc.contributor.authorSrnanek, Rudolf
dc.contributor.authorSciana, Beata
dc.contributor.authorRadziewicz, Damian
dc.contributor.authorBrammertz, Guy
dc.contributor.authorGoossens, Jozefien
dc.contributor.authorClarysse, Trudo
dc.contributor.authorVincze, Andrej
dc.date.accessioned2021-10-17T23:28:03Z
dc.date.available2021-10-17T23:28:03Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15600
dc.sourceIIOimport
dc.titleProgress in dopant and carrier profiling in GaAs structures
dc.typeProceedings paper
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.source.peerreviewno
dc.source.conference15th International Conference on Applied Physics and Condensed Matter
dc.source.conferencedate24/06/2009
dc.source.conferencelocationBystra Slovakia
imec.availabilityPublished - imec


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