Total ionizing dose effects on Ge pMOSFETs with high-k gate stack: on/off current ratio

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Authors

Kulkarni, S.R.; Schrimpf, R.D.; Galloway, K.F.; Arora, R.; Claeys, Cor; Simoen, Eddy

ISSN

0018-9499

Issue

4

Journal

IEEE Transactions on Nuclear Science

Volume

56

Title

Total ionizing dose effects on Ge pMOSFETs with high-k gate stack: on/off current ratio

Publication type

Journal article

Embargo date

9999-12-31

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