Show simple item record

Total ionizing dose effects on Ge pMOSFETs with high-k gate stack: on/off current ratio

dc.contributor.authorKulkarni, S.R.
dc.contributor.authorSchrimpf, R.D.
dc.contributor.authorGalloway, K.F.
dc.contributor.authorArora, R.
dc.contributor.authorClaeys, Cor
dc.contributor.authorSimoen, Eddy
dc.date.accessioned2021-10-17T23:37:37Z
dc.date.available2021-10-17T23:37:37Z
dc.date.issued2009
dc.identifier.issn0018-9499
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15630
dc.sourceIIOimport
dc.titleTotal ionizing dose effects on Ge pMOSFETs with high-k gate stack: on/off current ratio
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1926
dc.source.endpage1930
dc.source.journalIEEE Transactions on Nuclear Science
dc.source.issue4
dc.source.volume56
imec.availabilityPublished - open access


Files in this item

Thumbnail
Name:
19742.pdf
Size:
198.7Kb
Format:
PDF
View/open

This item appears in the following collection(s)

Show simple item record