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Simple and accurate measurements to characterize microdisk lasers for all-optical flip-flop operation

dc.contributor.authorKumar, Rajesh
dc.contributor.authorLiu, Liu
dc.contributor.authorRoelkens, Gunther
dc.contributor.authorMorthier, Geert
dc.contributor.authorBaets, Roel
dc.date.accessioned2021-10-17T23:37:54Z
dc.date.available2021-10-17T23:37:54Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15631
dc.sourceIIOimport
dc.titleSimple and accurate measurements to characterize microdisk lasers for all-optical flip-flop operation
dc.typeProceedings paper
dc.contributor.imecauthorRoelkens, Gunther
dc.contributor.imecauthorMorthier, Geert
dc.contributor.imecauthorBaets, Roel
dc.contributor.orcidimecRoelkens, Gunther::0000-0002-4667-5092
dc.contributor.orcidimecMorthier, Geert::0000-0003-1819-6489
dc.contributor.orcidimecBaets, Roel::0000-0003-1266-1319
dc.date.embargo9999-12-31
dc.source.peerreviewno
dc.source.beginpage81
dc.source.endpage84
dc.source.conferenceProceedings of the Annual Symposium of the IEEE Photononics Benelux Chapter
dc.source.conferencedate5/11/2009
dc.source.conferencelocationBrussels Belgium
imec.availabilityPublished - open access


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