SLM device for 193 nm lithographic applications
dc.contributor.author | Lauria, John | |
dc.contributor.author | Albright, R. | |
dc.contributor.author | Vladimirsky, O. | |
dc.contributor.author | Hoeks, M. | |
dc.contributor.author | Vanneer, R. | |
dc.contributor.author | van Drieenhuizen, B. | |
dc.contributor.author | Chen, L. | |
dc.contributor.author | Haspeslagh, Luc | |
dc.contributor.author | Witvrouw, Ann | |
dc.date.accessioned | 2021-10-17T23:44:19Z | |
dc.date.available | 2021-10-17T23:44:19Z | |
dc.date.issued | 2009 | |
dc.identifier.issn | 0167-9317 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15653 | |
dc.source | IIOimport | |
dc.title | SLM device for 193 nm lithographic applications | |
dc.type | Journal article | |
dc.contributor.imecauthor | Haspeslagh, Luc | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 569 | |
dc.source.endpage | 572 | |
dc.source.journal | Microelectronic Engineering | |
dc.source.issue | 4_6 | |
dc.source.volume | 86 | |
imec.availability | Published - open access | |
imec.internalnotes | Special issue MNE'08 |