Authors

Lin, Dennis; Brammertz, Guy; Martens, Koen; De Valicourt, Guilhem; Negre, Laurent; Wang, Wei-E; Tsai, Wilman; Meuris, Marc; Heyns, Marc

ISSN

0003-6951

Journal

Applied Physics Letters

Volume

94

Title

The Fermi-level efficiency method and its applications on high interface trap density oxide-semiconductor interfaces

Publication type

Journal article