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dc.contributor.authorLin, Dennis
dc.contributor.authorBrammertz, Guy
dc.contributor.authorSioncke, Sonja
dc.contributor.authorFleischmann, Claudia
dc.contributor.authorDelabie, Annelies
dc.contributor.authorMartens, Koen
dc.contributor.authorBender, Hugo
dc.contributor.authorConard, Thierry
dc.contributor.authorTseng, Joshua
dc.contributor.authorLin, Vic
dc.contributor.authorWang, Wei-E
dc.contributor.authorTemst, Kristiaan
dc.contributor.authorVantomme, Andre
dc.contributor.authorMitard, Jerome
dc.contributor.authorCaymax, Matty
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.contributor.authorHoffmann, Thomas Y.
dc.date.accessioned2021-10-18T00:04:36Z
dc.date.available2021-10-18T00:04:36Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15723
dc.sourceIIOimport
dc.titleEnabling the high-performance InGaAs/Ge CMOS: a common gate stack solution
dc.typeProceedings paper
dc.contributor.imecauthorLin, Dennis
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorFleischmann, Claudia
dc.contributor.imecauthorDelabie, Annelies
dc.contributor.imecauthorMartens, Koen
dc.contributor.imecauthorBender, Hugo
dc.contributor.imecauthorConard, Thierry
dc.contributor.imecauthorTemst, Kristiaan
dc.contributor.imecauthorVantomme, Andre
dc.contributor.imecauthorMitard, Jerome
dc.contributor.imecauthorCaymax, Matty
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.contributor.orcidimecFleischmann, Claudia::0000-0003-1531-6916
dc.contributor.orcidimecMartens, Koen::0000-0001-7135-5536
dc.contributor.orcidimecConard, Thierry::0000-0002-4298-5851
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage327
dc.source.endpage330
dc.source.conferenceIEEE International Electron Device Meeting - IEDM
dc.source.conferencedate7/12/2009
dc.source.conferencelocationBaltimore, MD USA
imec.availabilityPublished - open access


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