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Calibration of very fast TLP transients

dc.contributor.authorLinten, Dimitri
dc.contributor.authorRoussel, Philippe
dc.contributor.authorScholz, Mirko
dc.contributor.authorThijs, Steven
dc.contributor.authorGriffoni, Alessio
dc.contributor.authorSawada, M.
dc.contributor.authorHasebe, T.
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2021-10-18T00:05:37Z
dc.date.available2021-10-18T00:05:37Z
dc.date.issued2009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15726
dc.sourceIIOimport
dc.titleCalibration of very fast TLP transients
dc.typeProceedings paper
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.imecauthorRoussel, Philippe
dc.contributor.imecauthorThijs, Steven
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.contributor.orcidimecRoussel, Philippe::0000-0002-0402-8225
dc.contributor.orcidimecThijs, Steven::0000-0003-2889-8345
dc.source.peerreviewno
dc.source.beginpage63
dc.source.endpage68
dc.source.conferenceRCJ ( Reliability Center for electronic components of Japan ) Symposium
dc.source.conferencedate22/10/2009
dc.source.conferencelocationTokyo Japan
imec.availabilityPublished - imec


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