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Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs

dc.contributor.authorMaji, D.
dc.contributor.authorCrupi, Felice
dc.contributor.authorAmat, E.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorBrunco, David
dc.contributor.authorManoj, C.R.
dc.contributor.authorRamgopal Rao, V.
dc.contributor.authorMagnone, P.
dc.contributor.authorGiusi, G.
dc.contributor.authorPace, C.
dc.contributor.authorPantisano, Luigi
dc.contributor.authorMitard, Jerome
dc.contributor.authorRodríguez, R.
dc.contributor.authorNafría, M.
dc.date.accessioned2021-10-18T00:25:38Z
dc.date.available2021-10-18T00:25:38Z
dc.date.issued2009
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15791
dc.sourceIIOimport
dc.titleUnderstanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs
dc.typeJournal article
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorMitard, Jerome
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage1063
dc.source.endpage1069
dc.source.journalIEEE Transactions on Electron Devices
dc.source.issue5
dc.source.volume56
imec.availabilityPublished - open access


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