Publication:

Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs

Date

2009
Journal article
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Author(s)

Maji, D.
;
Crupi, Felice
;
Amat, E.
;
Simoen, Eddy  
;
De Jaeger, Brice  
;
Brunco, David
;
Manoj, C.R.
;
Ramgopal Rao, V.
;
Magnone, P.
;
Giusi, G.
;
Pace, C.
;
Pantisano, Luigi
;
Mitard, Jerome  
;
Rodríguez, R.
;
Nafría, M.

Journal

IEEE Transactions on Electron Devices

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