Publication:
Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs
Date
Loading...
Files
Journal
Abstract
Description
Metrics
Views
1978 since deposited on 2021-10-18
Acq. date: 2026-01-07
Citations
Metrics
Views
1978 since deposited on 2021-10-18
Acq. date: 2026-01-07
Citations