Publication:

Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs

Date

2009
Journal article
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dc.contributor.authorMaji, D.
dc.contributor.authorCrupi, Felice
dc.contributor.authorAmat, E.
dc.contributor.authorSimoen, Eddy
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorBrunco, David
dc.contributor.authorManoj, C.R.
dc.contributor.authorRamgopal Rao, V.
dc.contributor.authorMagnone, P.
dc.contributor.authorGiusi, G.
dc.contributor.authorPace, C.
dc.contributor.authorPantisano, Luigi
dc.contributor.authorMitard, Jerome
dc.contributor.authorRodríguez, R.
dc.contributor.authorNafría, M.
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorMitard, Jerome
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecMitard, Jerome::0000-0002-7422-079X
dc.date.accessioned2021-10-18T00:25:38Z
dc.date.available2021-10-18T00:25:38Z
dc.date.embargo9999-12-31
dc.date.issued2009
dc.identifier.issn0018-9383
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15791
dc.source.beginpage1063
dc.source.endpage1069
dc.source.issue5
dc.source.journalIEEE Transactions on Electron Devices
dc.source.volume56
dc.title

Understanding and optimization of hot-carrier reliability in germanium-on-silicon pMOSFETs

dc.typeJournal article
dspace.entity.typePublication
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