3-D technology assessment: path-finding the technology/design sweet-spot

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20150.pdf 1.33 MB

Author(s)

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Katti, Guruprasad

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Stucchi, Michele

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Papanikolaou, Antonis

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Verkest, Diederik

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Journal

Proceedings of the IEEE

Metrics

2011 since deposited on 2021-10-18

Acq. date: 2025-10-27