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3-D technology assessment: path-finding the technology/design sweet-spot
Publication:
3-D technology assessment: path-finding the technology/design sweet-spot
Date
2009
Journal article
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20150.pdf
1.33 MB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marchal, Pol
;
Bougard, Bruno
;
Katti, Guruprasad
;
Stucchi, Michele
;
Dehaene, Wim
;
Papanikolaou, Antonis
;
Verkest, Diederik
;
Swinnen, Bart
;
Beyne, Eric
Journal
Proceedings of the IEEE
Abstract
Description
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2011
since deposited on 2021-10-18
Acq. date: 2025-10-27
Citations
Metrics
Views
2011
since deposited on 2021-10-18
Acq. date: 2025-10-27
Citations