3-D technology assessment: path-finding the technology/design sweet-spot

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Authors

Marchal, Pol; Bougard, Bruno; Katti, Guruprasad; Stucchi, Michele; Dehaene, Wim; Papanikolaou, Antonis; Verkest, Diederik; Swinnen, Bart; Beyne, Eric

ISSN

0018-9219

Issue

1

Journal

Proceedings of the IEEE

Volume

97

Title

3-D technology assessment: path-finding the technology/design sweet-spot

Publication type

Journal article

Embargo date

9999-12-31

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