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3-D technology assessment: path-finding the technology/design sweet-spot

dc.contributor.authorMarchal, Pol
dc.contributor.authorBougard, Bruno
dc.contributor.authorKatti, Guruprasad
dc.contributor.authorStucchi, Michele
dc.contributor.authorDehaene, Wim
dc.contributor.authorPapanikolaou, Antonis
dc.contributor.authorVerkest, Diederik
dc.contributor.authorSwinnen, Bart
dc.contributor.authorBeyne, Eric
dc.date.accessioned2021-10-18T00:34:37Z
dc.date.available2021-10-18T00:34:37Z
dc.date.issued2009
dc.identifier.issn0018-9219
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15820
dc.sourceIIOimport
dc.title3-D technology assessment: path-finding the technology/design sweet-spot
dc.typeJournal article
dc.contributor.imecauthorStucchi, Michele
dc.contributor.imecauthorDehaene, Wim
dc.contributor.imecauthorVerkest, Diederik
dc.contributor.imecauthorSwinnen, Bart
dc.contributor.imecauthorBeyne, Eric
dc.contributor.orcidimecVerkest, Diederik::0000-0001-6567-2746
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.date.embargo9999-12-31
dc.source.peerreviewyes
dc.source.beginpage96
dc.source.endpage107
dc.source.journalProceedings of the IEEE
dc.source.issue1
dc.source.volume97
imec.availabilityPublished - open access


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