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Evaluating the risks and benefits of 3-D technology
Publication:
Evaluating the risks and benefits of 3-D technology
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Date
2009-08
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marchal, Pol
;
Van Bavel, Mieke
Journal
Semiconductor International
Abstract
Description
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1901
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Acq. date: 2025-12-16
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Metrics
Views
1901
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-16
Citations