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IEEE 1500 enables modular SOC testing

dc.contributor.authorMarinissen, Erik Jan
dc.contributor.authorZorian, Yervant
dc.date.accessioned2021-10-18T00:38:23Z
dc.date.available2021-10-18T00:38:23Z
dc.date.issued2009
dc.identifier.issn0740-7475
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/15832
dc.sourceIIOimport
dc.titleIEEE 1500 enables modular SOC testing
dc.typeJournal article
dc.contributor.imecauthorMarinissen, Erik Jan
dc.contributor.orcidimecMarinissen, Erik Jan::0000-0002-5058-8303
dc.source.peerreviewyes
dc.source.beginpage8
dc.source.endpage16
dc.source.journalIEEE Design & Test of Computers
dc.source.issue1
dc.source.volume26
dc.identifier.urlhttp://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=4760111&isnumber=4760105
imec.availabilityPublished - imec


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