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Articles
IEEE 1500 enables modular SOC testing
Publication:
IEEE 1500 enables modular SOC testing
Date
2009
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Marinissen, Erik Jan
;
Zorian, Yervant
Journal
IEEE Design & Test of Computers
Abstract
Description
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1891
since deposited on 2021-10-18
2
last week
Acq. date: 2025-10-29
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Metrics
Views
1891
since deposited on 2021-10-18
2
last week
Acq. date: 2025-10-29
Citations