Publication:
IEEE 1500 enables modular SOC testing
Date
| dc.contributor.author | Marinissen, Erik Jan | |
| dc.contributor.author | Zorian, Yervant | |
| dc.contributor.imecauthor | Marinissen, Erik Jan | |
| dc.contributor.orcidimec | Marinissen, Erik Jan::0000-0002-5058-8303 | |
| dc.date.accessioned | 2021-10-18T00:38:23Z | |
| dc.date.available | 2021-10-18T00:38:23Z | |
| dc.date.issued | 2009 | |
| dc.identifier.issn | 0740-7475 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/15832 | |
| dc.identifier.url | http://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=4760111&isnumber=4760105 | |
| dc.source.beginpage | 8 | |
| dc.source.endpage | 16 | |
| dc.source.issue | 1 | |
| dc.source.journal | IEEE Design & Test of Computers | |
| dc.source.volume | 26 | |
| dc.title | IEEE 1500 enables modular SOC testing | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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